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相變化記憶胞之模擬研究
Thesis

相變化記憶胞之模擬研究

孫榮佐
Masters, 國立清華大學, 材料科學工程學系
2005

Abstract

相變化記憶體 模擬 phase-change memory simulation
Phase-change random access memory is considered a potential challenger for conventional memories,Nevertheless,high reset current is the ultimate problem in developing high-density phase-change random access memory(PRAM). Therefore, Phase-change memory cell with four different geometry configurations were studied by using ANSYS suit software.We can find the effect of geometry configurations and then find the best geometry structure.

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