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高加速壽命試驗溫度與震動失效模式檢測分析
Thesis

高加速壽命試驗溫度與震動失效模式檢測分析

吳亮東
Masters, 國立清華大學, 工程與系統科學系
2009

Abstract

高加速壽命試驗系統 操作能力極限 損壞極限 失效模式 Highly Accelerated Life Test Operating Limitation Failure test
In twenty-first century, products are getting more and more technical and multifunctional; lots of researchers start to join the team and create new innovation. Meanwhile, when the products become smaller and more powerful, it also means that there are many challenges have to be solved. It is become an important issue about how to acquire products’ property of function operating limitation. According to some experiments and analysis, we can know that the most failure factors of product are the temperature and vibration. In order to make sure the product’s fundamental limit, Highly Accelerated Life Test (HALT) is the best tool to get the information; HALT is a process in which products are subjected to accelerated environments to find weak links in the design and manufacturing process. In this research, we choose two samples for the HALT experiment test, one is a system and another is a motherboard. After the temperature stress, vibration stress, combined thermal and vibration stress, we can claim that the system can work within -30℃ to 75℃, under 50 Grms vibration. And motherboard works within -25℃ to 45℃under 40 Grms. Although HALT isn’t a true life test, using HALT process can determine operation and endurance limit. At each level of applied stress, functional testing is performed on the product sample to evaluate its operation. When a failure occurs, the failure mode and stress level is recorded, and the root cause of the failure is determined. As the failure modes are found and eliminated, limits are pushed further and further out, maximizing margins and increasing the product’s life and reliability.

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