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A 28-nm 320-Kb TCAM Macro Using Split-Controlled Single-Load 14T Cell and Triple-Margin Voltage Sense Amplifier
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A 28-nm 320-Kb TCAM Macro Using Split-Controlled Single-Load 14T Cell and Triple-Margin Voltage Sense Amplifier

Cheng-Xin Xue, Wei-Cheng Zhao, Tzu-Hsien Yang, Yi-Ju Chen, Hiroyuki YamauchiMeng-Fan Chang
IEEE Journal of Solid-State Circuits, 卷.54(10), 頁碼.2743-2753
10/2019

摘要

Sense amplifier (SA) SRAM ternary content-addressable memory (TCAM) Electrical and Electronic Engineering
Ternary content-addressable memory (TCAM) is limited by large cell area, high search power, significant active-mode leakage current, and a tradeoff between search speed and signal margin on the match-line (ML). In this paper, we developed a split-controlled single-load 14T (SCSL-14T) TCAM cell and a triple-margin voltage sense amplifier (TM-VSA) to achieve the following: 1) compact cell area; 2) lower search delay and search energy; 3) reduced current leakage in standby and active modes; and 4) tolerance for small sensing margin. A testchip with 320-Kb 14T-TCAM macro was fabricated using a 28-nm CMOS logic process and modified compact foundry six-transistor (6T) cell. The proposed macro achieved search delay of only 710 ps and 0.422 fJ/bit/search.

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