Ultra-small-angle neutron scattering (USANS) using Bonse-Hart optics provides micrometer-scale structural insights but suffers from severe slit-geometry smearing. While well-established for isotropic systems, quantitative desmearing of anisotropic data remains a challenge because conventional corrections break down for non-radial scattering. We address this by developing a resolution-aware Bayesian framework that explicitly incorporates anisotropy via an affine deformation to the scattering pattern, guided by the principle of parsimony. This results in orientation-resolved point-spread functions that enable a self-consistent determination of both the resolution and deformation parameters. Using Gaussian process regression with uncertainty quantification and a probabilistic correction for multiple scattering, we demonstrate the framework's effectiveness through numerical benchmarks and experimental studies of a stretched polymer melt. Our approach enables the seamless integration of SANS and USANS data, facilitating quantitative structural analysis of deformed materials at nanometer to micrometer scales.
- A Bayesian desmearing algorithm for Bonse-Hart USANS with anisotropic scattering
- Chi-Huan Tung - Oak Ridge National LaboratoryGuan-Rong Huang - National Tsing Hua UniversityYangyang Wang - Oak Ridge National LaboratoryJan-Michael Carrillo - Oak Ridge Natl Lab, Ctr Nanophase Mat Sci, Oak Ridge, TN 37831 USAYuya Shinohara - Oak Ridge National LaboratoryChangwoo Do - Oak Ridge National LaboratoryGernot Rother - Oak Ridge National LaboratoryYingrui Shang - Oak Ridge National LaboratoryWei-Ren Chen - Oak Ridge National LaboratoryOak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- AIP Publishing
- 12
- Basic Energy Sciences; United States Department of Energy (DOE) 111-2112-M-110- 021-MY3; 113-2112-M-029-007; 114-2112-M- 029-008; 114-2628-M-007-004-MY4 / National Science and Technology Council 34532; IPTS-35884.1 / Office of Science; United States Department of Energy (DOE)
- Journal article
- 28/04/2026
- The Journal of chemical physics, Vol.164(16), 164108
- English