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A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source
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A Highly Reliable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source

Bohan Lin, Yachuan Pang, Bin Gao, Jianshi Tang, Dong Wu, Ting-Wei Chang, Wei-En Lin, Xiaoyu Sun, Shimeng Yu, Meng-Fan Chang, …
IEEE Journal of Solid-State Circuits
2021

摘要

Device-to-device communication Hardware Hardware security Physical unclonable function physical unclonable function (PUF) post-process randomness reconfigurability Reliability Resistance resistive random access memory (RRAM). Security Switches Electrical and Electronic Engineering
Physically unclonable function (PUF) has been increasingly used as a promising primitive for hardware security with a wide range of applications in the Internet of Things (IoT). In recent years, novel PUF techniques based on resistive switching mechanism in various emerging nonvolatile memories have demonstrated superior performance on reliability and integration density. In this work, a resistive random access memory (RRAM)-based PUF chip with 8-kb capacity is developed. Two operation modes, namely differential mode and median mode, are embedded on chip. To implement these modes, a current sampling-based sense amplifier is designed to distinguish the current values of the PUF cells and the reference cell. In addition, a split-resistance scheme is proposed to enhance the PUF's reliability significantly. The experiment results show that the differential PUF exhibits excellent performance with native bit error rate (N-BER) below 6 x 10&null and inter-Hamming distance (inter-HD) of 49.99&null In the meanwhile, the reconfigurability of PUF challenge-response pairs (CRPs) is demonstrated with 49.77&null and 47.29&null reconfigure-Hamming distance (reconfigure-HD) in the median mode and the differential mode, respectively.

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