摘要
A speeded item response model is proposed. We consider the situation where examinees may retain the harder items to a later test period in a time limit test. With such a strategy, examinees may not finish answering some of the harder items within the allocated time. In the proposed model, we try to describe such a mechanism by incorporating a speeded-effect term into the two-parameter logistic item response model. A Bayesian estimation procedure of the current model using Markov chain Monte Carlo is presented, and its performance over the two-parameter logistic item response model in a speeded test is demonstrated through simulations. The methodology is applied to physics examination data of the Department Required Test for college entrance in Taiwan for illustration. © 2013 The Psychometric Society.