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A contact-resistive random-access-memory-based true random number generator
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A contact-resistive random-access-memory-based true random number generator

Chien-Yuan Huang, Wen Chao Shen, Yuan-Heng Tseng, Ya-Chin KingChrong-Jung Lin
IEEE Electron Device Letters, 卷.33(8), 頁碼.1108-1110
2012

摘要

Contact-resistive random access memory (CRRAM) random telegraph noise (RTN) random-number generator Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
A new type of true random number generator, based on the random telegraph noise of a contact-resistive random access memory device, is proposed in this letter. The random-number generator consists of only a simple bias circuit plus a comparator, leading to small circuit area and low power consumption. By realizing this generator by the 65-nm complementary metal-oxide-semiconductor logic process, the occupied area can be as low as 45 mu;m 2 , demonstrating substantial saving in the circuit area. © 2012 IEEE.

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