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A flexible PCB inspection system based on statistical learning
Journal article   Peer reviewed

A flexible PCB inspection system based on statistical learning

Chia-Te Liao, Wen-Hao Lee and Shang-Hong Lai
Journal of Signal Processing Systems, Vol.67(3), pp.279-290
06/2012

Abstract

Automated visual inspection Defect classification Image alignment Image classification PCB SVM
With the large variations in appearance for different kinds of defects in Printed Circuit Boards (PCBs), conventional rule-based inspection algorithms become insufficient for detecting and classifying defects. In this study, an automated PCB inspection system based on statistical learning strategies is developed. First, the partial Hausdorff distance is used to ascertain the positions of defects. Next, the defect patterns are categorized using the Support Vector Machine (SVM) classifier. Defects without regularities in appearance, which cannot be categorized, are identified through the regional defectiveness by comparing the block-wise probability distributions. Experimental results on a real visual inspection platform show that the proposed system is very effective for inspecting a variety of PCB defects. © Springer Science+Business Media, LLC 2010.

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