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A fully differential CMOS-MEMS DETF oxide resonator with Q > 4800 and positive TCF
Journal article   Peer reviewed

A fully differential CMOS-MEMS DETF oxide resonator with Q > 4800 and positive TCF

Wen-Chien Chen, Ming-Huang Li, Yu-Chia Liu, Weileun Fang and Sheng-Shian Li
IEEE Electron Device Letters, Vol.33(5), pp.721-723
05/2012

Abstract

0.18-m CMOS Process;CMOS-MEMS;Double-ended tuning-fork (DETF);Embedded electrode;Fully differential;Micromechanical resonators;Oxide structure Electrical and Electronic Engineering,Electronic Optical and Magnetic Materials
A fully differential CMOS-MEMS double-ended tuning-fork (DETF) oxide resonator fabricated using a 0.18-μm CMOS process has been demonstrated with a Q greater than 4800 and more-than-20-dB stopband rejection at 10.4 MHz. The key to attaining such a performance attributes to the use of oxide structures with embedded metal electrodes, where SiO 2 offers a Q enhancement (at least a 3-times-higher Q) as compared to other CMOS-MEMS-based composite resonators with similar structures and vibrating modes and where flexible electrical routing facilitates fully differential configuration to suppress capacitive feedthroughs. In addition, the resonators developed in this work possess a positive temperature coefficient of frequency (TC f ) and mode-splitting capability, therefore indicating a great potential for temperature compensation and spurious-mode suppression, respectively. This technology paves a way to realize fully integrated CMOS-MEMS oscillators and filters which might benefit future single-chip transceivers for wireless communications. © 2012 IEEE.

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