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A highly scalable interface fuse for advanced CMOS logic technologies
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A highly scalable interface fuse for advanced CMOS logic technologies

Li-Yu Yang, Min-Che Hsieh, Jheng-Sin Liu, Yung-Wen Chin 和 Chrong Jung Lin
IEEE Electron Device Letters, 卷.33(2), 頁碼.245-247
02/2012
Web of Science ID: 000299812300039

摘要

Electrically programmable fuse metal-contact interface
In this letter, we propose a novel interface fuse (iFuse) for low-power electrically programmable fuses in advanced CMOS applications. With an offset-landed metal-to-contact or contact-to-polysilicon structure, the iFuse can be programmed by substantially reduced current as compared to conventional fuses. A diagonal contact layout and the optical pattern correction scheme can further improve the cell stability as well as its programming characteristics. © 2011 IEEE.

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引用書目主題
5 Physics
5.31 Silicon Systems
5.31.272 MOSFET Advancements
Web Of Science研究領域
Engineering, Electrical & Electronic
ESI研究領域
Engineering

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