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A sampling scheme for resubmitted lots based on one-sided capability indices
期刊文章

A sampling scheme for resubmitted lots based on one-sided capability indices

Nani Kurniati, Ruey-Huei YehChien-Wei Wu
Quality Technology and Quantitative Management, 卷.12(4), 頁碼.501-515
02/2016

摘要

Acceptance sampling One-sided specification limit Process yield Sampling plan Business and International Management Industrial Relations Management Science and Operations Research Information Systems and Management Management of Technology and Innovation
Acceptance sampling plans provide decision rules for lot acceptance determination based on the required quality levels and allowable risks. In this paper, we develop a variables sampling plan based on the one-sided process capability indices, C PU and C PL , when lot resubmissions are permitted on non-acceptance of the original inspection. The plan parameters are determined by solving two non-linear equations simultaneously and fulfill the two-point condition on the operating characteristic (OC) curve. The OC curve of the proposed plan is derived based on the exact sampling distribution rather than approximation. Moreover, the behavior of the proposed resubmitted sampling plan for various parameters is examined and discussed. For practical purposes, the sample size and critical acceptance value are tabulated for various parameter values. An example is used to demonstrate the implementation of the proposed resubmitted sampling plan.

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