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A simple and wide-range refractive index measuring approach by using a sub-micron grating
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A simple and wide-range refractive index measuring approach by using a sub-micron grating

Chun-Wei Liu, Chun-Wei Liu, Chun-Che WuShih-Chieh Lin
Applied Physics Letters, 卷.106(15), 151907
04/2015

摘要

Physics and Astronomy (miscellaneous)
This paper presents the design and simulation results of a high-precision low-cost refractometer that demonstrates the main advantage of a wide measurement range (1 ≤ n ≤ 2). The proposed design is based on the diffractive properties of sub-micron gratings and Snell's Law. The precision and uncertainty factors of the proposed system were tested and analyzed, revealing that the proposed refractometer demonstrates a wide measurement range with sensitivity of 10 -4 .

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