摘要
The thin-film-transistor liquid crystal display (TFT-LCD) array process is usually the longest process in TFT-LCD production. During the TFT-LCD array process, the scheduling problem of the photolithography stage entails complicated constraints such as photo mask availability, available machines for jobs, and limited waiting time. This study proposes a two-phase decoding genetic algorithm (TDGA) to maximize utilization in the photolithography stage, which is usually the bottleneck. An empirical study was conducted at a leading TFT-LCD manufacturing company. To compare the performance of the TDGA with other metaheuristics, eight scenarios were simulated based on the empirical data. The experimental results show the practical viability of the proposed TDGA.