Logo image
Amorphous zinc-doped silicon oxide (SZO) resistive switching memory: Manipulated bias control from selector to memristor
Journal article   Peer reviewed

Amorphous zinc-doped silicon oxide (SZO) resistive switching memory: Manipulated bias control from selector to memristor

Jian-Shiou Huang, Wen-Chun Yen, Shih-Ming Lin, Chi-Yung Lee, Jiang Wu, Zhiming M. Wang, Tsung-Shune Chin and Yu-Lun Chueh
Journal of Materials Chemistry C, Vol.2(22), pp.4401-4405
14/06/2014

Abstract

Manipulated bias control of a selector to a memristor was demonstrated in Zn-doped amorphous SiO x (SZO) films, within which ZnO x /Zn nanoclusters were segregated. For the selector, namely diode-like (pre-forming) switching, the threshold voltage varied from 9 to 2.7 V, with a resistance ratio of ∼10 4 , by tuning the concentration of ZnO x /Zn nanoclusters. Stable bipolar resistive switching was achieved by current-controlled RESET and voltage-controlled SET processes. The working mechanism of the selector was explained by a transport mechanism which involved the "generalized trap-assisted tunnelling" of electrons resulting from doping with ZnO x /Zn nanoclusters. The dual-switching-mode of SZO provides a promising application for 3D cross-bar RRAM. © 2014 the Partner Organisations.

Metrics

1 Record Views

Details

Logo image