Logo image
An improved approach for process performance evaluation with the consideration of process yield and quality loss
Journal article   Peer reviewed

An improved approach for process performance evaluation with the consideration of process yield and quality loss

Chien-Wei Wu, Chi-Wei Lin and James C. Chen
International Journal of Production Research, Vol.51(21), pp.6397-6409
01/11/2013

Abstract

confidence interval performance evaluation process yield quality loss
In recent years, several process capability indices have received considerable research attention and increased usage in evaluating process performance and purchasing decisions in manufacturing industries. In particular, the third-generation capability index C pmk is constructed by taking process yield and quality loss into consideration. Unfortunately, the sampling distribution of the estimated C pmk is complicated, making the establishment of the exact confidence interval very difficult. Thus, this study applies the concept of the generalised pivotal quantity (GPQ) to derive the generalised confidence interval (GCI) for the index C pmk . To examine the performance and the effectiveness of the GCI approach, a series of simulations is undertaken. Three types of bootstrap methods are also implemented and compared with the proposed GCI approach. The results reveal that the proposed GCI approach is superior to the three bootstrap methods since the obtained coverage rates are very close to the nominal confidence level in most of our studied cases even for small sample sizes. Therefore, this article recommends the GCI approach for evaluating process performance in real applications. © 2013 Taylor & Francis.

Metrics

1 Record Views

Details

Logo image