Abstract
The investigation of anisotropic optical properties of vacuum-deposited ter(9,9-diarylfluorene)s thin films using variable-angle spectroscopic ellipsometry was reported. Under deposition conditions typical for thin-film organic devices, both real and imaginary parts of refractive indices of vacuum-deposited ter(9,9-diarylfluorene) films exhibit rather significant uniaxial anisotropy with the optical axis along the surface normal. In particular, for the absorption associated with the π-π* transition of the terfluorene backbone, they show substantially larger in-plane extinction coefficients than the out-of-plane extinction coefficients.