摘要
Process-capability analysis is considered one of the most important engineering decision tools among various quality-Assurance activities. For processes with an S-Type quality characteristic, the index Cpu can provide an exact measure for process yield, and properly reflects the process quality. In real applications, variation between batches often exists in the manufacturing process. Therefore, this study describes data by the one-way randomeffect model, and provides the generalized confidence interval for assessing Cpu. Simulations show that our proposed method is not affected by the increasing batch effect, and performs well when the total sample size is large enough.