Atomic-scale observation of spontaneous hole doping and concomitant lattice instabilities in strained nickelate films

I. C. Lin, M. H. Lee, P. C. Wu, S. C. Lin, J. W. Chen, C. C. Li, G. Y. Guo, Y. H. Chu, R. Sankar M. W. Chu

New journal of physics, Vol.24(2), 023011

01/02/2022

: WOS:000753638600001

charge doping

electron energy-loss spectroscopy

epitaxial strains

nickel oxides

scanning transmission electron microscopy

(1)

url

https://doi.org/10.1088/1367-2630/ac4b10

Published (Version of record)

1

: Atomic-scale observation of spontaneous hole doping and concomitant lattice instabilities in strained nickelate films
: I. C. Lin - National Taiwan University
M. H. Lee - National Taiwan University
P. C. Wu - National Yang Ming Chiao Tung University
S. C. Lin - National Yang Ming Chiao Tung University
J. W. Chen - National Yang Ming Chiao Tung University
C. C. Li - National Taiwan University
G. Y. Guo - National Center for Theoretical Sciences, Physics Division
Y. H. Chu - National Tsing Hua University, College of Semiconductor Research
R. Sankar - National Taiwan University
M. W. Chu - National Taiwan University
: Institute of Physics
: Ministry of Education in Taiwan Academia Sinica (http://data.elsevier.com/vocabulary/SciValFunders/501100001869) Ministry of Science and Technology, Taiwan (http://data.elsevier.com/vocabulary/SciValFunders/501100004663)
: Journal article
: 01/02/2022
: New journal of physics, Vol.24(2), 023011
: English