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C60 encapsulation of the Si(111)-(7×7) surface
Journal article   Peer reviewed

C60 encapsulation of the Si(111)-(7×7) surface

Hawoong Hong, W.E. McMahon, P. Zschack, D.-S. Lin, R.D. Aburano, Haydn Chen and T.-C. Chiang
Applied Physics Letters, Vol.61(26), pp.3127-3129
1992

Abstract

The structure of a Si(111)-(7×7) surface capped by a 200 Å film of C 60 was studied by grazing-incidence x-ray diffraction. The Si(111)-(7×7) reconstruction prepared in vacuum, including the loosely bonded "adatoms" on the surface, is preserved under the C 60 overlayer. This result illustrates that C 60 can be used as an inert cap for surfaces and suggests potentially interesting applications in surface science research and electronic device engineering.

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