Abstract
Recently, we have reported a significant enhancement (<500 times in intensity) in terahertz emission from Mg-doped indium nitride (InN:Mg) films compared to undoped InN. It was found that the intensity of terahertz radiation strongly depends on the background electron density. In this letter, we present the results on ultrafast time-resolved reflectivity measurement employed to investigate the carrier dynamics of InN:Mg. We find that the decay time constant of InN:Mg depends on background electron density in the same way as terahertz radiation does. The spatial redistribution of carriers in diffusion and drift is found to be responsible for the recombination behavior as well as terahertz radiation. © 2010 American Institute of Physics.