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Cellular automata for efficient parallel logic and fault simulation
Journal article   Peer reviewed

Cellular automata for efficient parallel logic and fault simulation

Yih-Lang Li and Cheng-Wen Wu
IEEE Xplore Digital Library IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.14(6), pp.740-749
1995

Abstract

Circuit simulation;Circuit faults;Combinational circuits;Pipeline processing;Boolean functions;Logic gates;Signal mapping;Benchmark testing;Circuit testing;Performance evaluation
We present a unilateral 2D cellular automata (CA) model and pipelining technique to parallelize logic and fault simulation. We show that given an acyclic digraph describing the Boolean function of a combinational circuit at the gate level, whose nodes are the logic gates of the circuit and whose directed edges stand for the propagating directions of signals, we can map this digraph onto a 2D CA to simulate the signal propagation of the circuit on the CA. This mapping preserves not only the electrical connectivity of the circuit but also the massive parallelism inherited from the CA. Experimental results on ISCAS-85 benchmark circuits are obtained. Compared with previous fault simulation results, the time required for simulating one test pattern on an average is shorter by three to four orders of magnitude. As to pure logic simulation, our CA performs up to 9.24 billion gate evaluations per second using a 20 MHz clock and 8-b words. Scalability and extension to sequential circuits are discussed

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