摘要
We demonstrate how combining highly-charged ions and exotic atoms measurements can provide high-accuracy information on particle properties, like the pion mass, on interactions, like the pion-proton strong interaction at low energy, and bound-state QED in strong fields. The use of highly-charged ion X-rays emitted by the plasma inside a super-conducting ion source provides a very detailed characterization of the response function of the X-ray spectrometer used to study exotic atoms, allowing for very accurate measurements. Conversely the use of the same high-resolution and high transmission spectrometer provides very accurate measurements of X-ray lines of few-electron ions. © 2008.