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Characterization of single 1.8-nm Au nanoparticle attachments on AFM tips for single sub-4-nm object pickup
Journal article   Open access   Peer reviewed

Characterization of single 1.8-nm Au nanoparticle attachments on AFM tips for single sub-4-nm object pickup

Hui-Wen Cheng, Yuan-Chih Chang, Song-Nien Tang, Chi-Tsu Yuan, Jau Tang and Fan-Gang Tseng
Nanoscale Research Letters, Vol.8(1), pp.1-10
2013

Abstract

AFM Au nanoparticle Blinking Quantum dots
This paper presents a novel method for the attachment of a 1.8-nm Au nanoparticle (Au-NP) to the tip of an atomic force microscopy (AFM) probe through the application of a current-limited bias voltage. The resulting probe is capable of picking up individual objects at the sub-4-nm scale. We also discuss the mechanisms involved in the attachment of the Au-NP to the very apex of an AFM probe tip. The Au-NP-modified AFM tips were used to pick up individual 4-nm quantum dots (QDs) using a chemically functionalized method. Single QD blinking was reduced considerably on the Au-NP-modified AFM tip. The resulting AFM tips present an excellent platform for the manipulation of single protein molecules in the study of single protein-protein interactions. © 2013 Cheng et al.; licensee Springer.
url
https://doi.org/10.1186/1556-276X-8-482View
Published (Version of record) Open

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