Abstract
Due to their high aspect ratio, well-defined cylindrical structure, and good electrical conductivity, carbon nanotubes ~CNTs! are ideal probes for ‘‘true’’ local imaging of electric domain structures at the nanoscale. By performing force–distance measurements and tip-shape profiling with a uniformly charged oxide square, we clearly demonstrate the local nature of the CNT tip for electrostatic force microscopy. We show that CNTs can be used to probe long-range electrostatic forces with a lateral resolution better than 5 nm. © 2002 American Institute of Physics.