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Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms
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Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms

Y. Hwu, H.H. Hsieh, M.J. Lu, W.L. Tsai, H.M. Lin, W.C. Goh, B. Lai, J.H. Je, C.K. Kim, D.Y. Noh, …
Journal of Applied Physics, 卷.86(8), 頁碼.4613-4618
10/1999

摘要

Physics and Astronomy (all)
Tests performed in different regimes reveal the interplay of two edge-enhancement mechanisms in radiological images taken with coherent synchrotron light. The relative weight of the two mechanisms, related to refraction and to Fresnel edge diffraction, can be changed in a controlled way. This makes it possible to obtain different images of the same object with complementary information. © 1999 American Institute of Physics.

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