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Comparative measurements of the piezoelectric coefficient of a lead zirconate titanate film by piezoresponse force microscopy using electrically characterized tips
Journal article   Peer reviewed

Comparative measurements of the piezoelectric coefficient of a lead zirconate titanate film by piezoresponse force microscopy using electrically characterized tips

Heh-Nan Lin, Sy-Hann Chen, Shu-Te Ho, Ping-Ren Chen and I-Nan Lin
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, Vol.21(2), pp.916-918
03/2003

Abstract

The comparative measurements of the piezoelectric coefficient d 33 of a lead zirconate titanate (PZT) film by piezoresponse force microscopy based on tip/PZT/electrode and tip/electrode/PZT/electrode configurations were discussed. With the use of electrically characterized Au-coated tips, the obtained values were found to be in good agreement. The analysis showed that d 33 was reasonably determined without the use of a top electrode as long as the electrical quality of the tip was qualified.

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