Abstract
Critical path selection is an indispensable step for testing of small-size delay defects. Historically, this step relies on the construction of a set of worst-case paths, where the timing lengths of the paths are calculated based upon discrete-valued timing models. The assumption of discrete-valued timing models may become invalid for modeling delay effects in the deep submicron domain, where the effects of timing defects and process variations are often statistical in nature. This paper studies the problem of critical path selection for testing small-size delay defects, assuming that circuit delays are statistical. We provide theoretical analysis to demonstrate that the new path-selection problem consists of two computationally intractable subproblems. Then, we discuss practical heuristics and their performance with respect to each subproblem. Using a statistical defect injection and timing-simulation framework, we present experimental results to support our theoretical analysis.