Data Value Development to Enhance Yield and Maintain Competitive Advantage for Semiconductor Manufacturing,

Journal article

International Journal of Service Technology and Management International Journal of Service Technology and Management, Vol.4(4), pp.365-383

2003

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Title: Data Value Development to Enhance Yield and Maintain Competitive Advantage for Semiconductor Manufacturing,
Creators - without role: C. Peng
Chen-Fu Chien - 國立清華大學工學院工業工程與工程管理學系
Publication Details: International Journal of Service Technology and Management International Journal of Service Technology and Management, Vol.4(4), pp.365-383
Identifiers: 9957769910506774
Academic Unit: Department of Industrial Engineering and Engineering Management, College of Engineering, National Tsing Hua University
Language: Traditional Chinese
Resource Type: Journal article