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Developing a failure-censored two-plan sampling system for product reliability validation under the Weibull distribution
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Developing a failure-censored two-plan sampling system for product reliability validation under the Weibull distribution

To-Cheng Wang, Chien-Wei Wu 和 Ming-Hung Shu
Advanced engineering informatics, 卷.67, 頁.103584
01/09/2025
Web of Science ID: WOS:001521369100003

摘要

Computer Science Computer Science, Artificial Intelligence Engineering Engineering, Multidisciplinary Science & Technology Technology
Product reliability is crucial for consumer decision-making and brand reputation, driving companies to offer warranties and invest in reliability verification. Sampling inspections with lifetime testing play a key role in managing repair costs efficiently. Acceptance sampling plans (ASPs) are widely employed for this purpose, and recent advancements have integrated ASPs with failure-censored schemes to reduce testing time and costs while ensuring sufficient product life data. Although the failure-censored quick-switching sampling system (FQSS) has demonstrated strong performance, its rigid decision rules may limit practical applicability. This study proposes a more flexible alternative-the failure-censored tightened-normal-tightened sampling system (FTSS), which utilizes the lifetime performance index to enable adaptive decision-making. Comparative analyses demonstrate that the proposed FTSS enhances cost-effectiveness and discriminatory power in reliability assessment, making it particularly beneficial for high-cost lifetime testing. A case study on the reliability verification of lithium batteries for electric vehicles highlights the industrial relevance and practical advantages of the FTSS method.

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