Direct Mapping of Octahedral Tilts in Perovskite Oxide Materials Using Bright Field Scanning Transmission Electron Microscopy

Journal article

Y.-M. Kim, P. Yu, Y.-H. Chu, R. Ramesh, S.J. Pennycook, S.V. Kalinin and A.Y. Borisevich

Microscopy and Microanalysis, Vol.18, pp.420-421

2012

Abstract

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Title: Direct Mapping of Octahedral Tilts in Perovskite Oxide Materials Using Bright Field Scanning Transmission Electron Microscopy
Translated title: Direct Mapping of Octahedral Tilts in Perovskite Oxide Materials Using Bright Field Scanning Transmission Electron Microscopy
Creators - without role: Y.-M. Kim - Oak Ridge National Laboratory
P. Yu - University of California-Berkely
Y.-H. Chu - National Yang Ming Chiao Tung University
R. Ramesh - University of California-Berkely
S.J. Pennycook - Oak Ridge National Laboratory
S.V. Kalinin - Oak Ridge National Laboratory
A.Y. Borisevich - Oak Ridge National Laboratory
Publication Details: Microscopy and Microanalysis, Vol.18, pp.420-421
Identifiers: 9957767351506774
Academic Unit: Department of Materials Science and Engineering, College of Engineering, National Tsing Hua University
Language: English
Resource Type: Journal article