Abstract
We demonstrate a direct surface structural tool with high resolution of ∼1 A in all directions by direct Fourier transformation of measured Kikuchi patterns using a multiple-energy phase-summing method. In this method, with an integral over continuous energy spectra in each direction, both the forward- and backward-scattering oscillations are selected for Fourier transformation by varying the energy range and size of the grid. High-fidelity and artifact-free three-dimensional images of Ag atoms for (100) and (111) single-crystal surfaces are obtained. © 1994 The American Physical Society.