摘要
A study was conducted to control the ferroelectric domain structure in BiFeO 3 (BFO) films through the use of vicinal SrTio 3 (STO) substrates. The ferroelectric domain structure of an epitaxial BFO films on STO substrates with different orientations is modeled using the phase-field method. The ferroelectric polarization variants in the films were characterized by piezoelectric force microscopy, where structural variants were analyzed and confirmed by X-ray diffraction. Morphology and local piezoelectric properties of films were investigated using an atomic force microscopy (AFM). X-ray scattering was used to confirm the domain architecture to verify the structural properties of the films. The downward directed polarization variants are observed, indicating the existence of a self-poling effect of the films.