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Domain structure study of SrBi2Ta2O9 ferroelectric thin films by scanning capacitance microscopy
Journal article   Peer reviewed

Domain structure study of SrBi2Ta2O9 ferroelectric thin films by scanning capacitance microscopy

Ching-Chich Leu, Chih-Yuan Chen, Chao-Hsin Chien, Mao-Nan Chang, Fan-Yi Hsu and CHEN-TI HU
Applied Physics Letters, Vol.82(20), pp.3493-3495
19/05/2003

Abstract

The domain structure study of SrBi 2 Ta 2 O 9 ferroelectric thin films using scanning capacitance microscopy was presented. A sharp image contrast was found to be induced between the nanosized domains owing to the various polarities. The analysis showed that the reversal polarization process of a ferroelectric domain was found to be much easier inside a large grain than in a small grain.

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