摘要
The HOY (Hypothesis, Odyssey, and Yield) test system provides wireless test access and embedded DFT, while offering lower cost and better performance than conventional ATE. This article briefly describes HOY, then proposes a test cost model to compare it with conventional ATE, and analyzes the test cost of these two methods for different manufacturing processes, area overheads, die sizes, manufacturing volumes, and test times. © 2006 IEEE.