Logo image
Effect of width on the stress-induced bending of micromachined bilayer cantilevers
期刊文章

Effect of width on the stress-induced bending of micromachined bilayer cantilevers

Max Ti-Kuang HouRongshun Chen
Journal of Micromechanics and Microengineering, 卷.13(1), 頁碼.141-148
01/2003

摘要

Electronic Optical and Magnetic Materials Mechanics of Materials Mechanical Engineering Electrical and Electronic Engineering
In this paper, the effect of cantilever width is demonstrated on the stress-induced bending of micromachined bilayer cantilevers. In previous literature, the bilayer cantilever has been modeled as a two-dimensional structure; consequently, the stress-induced bending of micromachined bilayer cantilever was considered to be independent upon the width. In this study, the fabrication and characterization of various widths of micromachined bilayer cantilever have been performed to observe the out-of-plane deformation caused by residual stresses. A finite element model has been established to analyze such a deformation. With the support of experimental and numerical results, width dependence in the stress-induced bending of micromachined bilayer cantilever has been discussed. As a result, the tip deflection of the bilayer cantilever gradually increases as the width increases until the width-to-length ratio reaches a critical value, in which the micromachined bilayer cantilever can be regarded as an infinitely wide cantilever, and any cross section along the length is in plane strain state. Furthermore, width-independent design, which exists among very wide cantilevers with various widths, has also been reported. Thus a more reliable design can be achieved.

相關連結

指標

1 檢視次數

詳細資料

Logo image