Effects of Probe Beam Offset on Quantitative Measurement in Photothermal Beam Deflection Spectroscopy

期刊文章

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Masaaki Harada, Shigeo Obata, Takehiko Kitamori 和 Tsuguo Sawada

Analytical Chemistry, 卷.65(15), 頁碼.2181-2183

08/1993

摘要

Analytical Chemistry

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題名: Effects of Probe Beam Offset on Quantitative Measurement in Photothermal Beam Deflection Spectroscopy
翻譯題名: Effects of Probe Beam Offset on Quantitative Measurement in Photothermal Beam Deflection Spectroscopy
創作者：: Masaaki Harada (作者) - Department of Industrial Chemistry , Faculty of Engineering , University of Tokyo
Shigeo Obata (作者) - Department of Industrial Chemistry , Faculty of Engineering , University of Tokyo
Takehiko Kitamori (作者) - Department of Industrial Chemistry , Faculty of Engineering , University of Tokyo
Tsuguo Sawada (作者) - Department of Industrial Chemistry , Faculty of Engineering , University of Tokyo
學術資源類型: 期刊文章
出版日期: 08/1993
出版資訊: Analytical Chemistry, 卷.65(15), 頁碼.2181-2183
語言: 英語