Abstract
Effects of green density difference on camber and stress development during the cofiring of a bi-layer glass-based dielectric laminate have been investigated. A larger shrinkage rate is observed for the tape with a lower green density, toward which camber develops during cofiring. The sintering mismatch stress, which is calculated from the camber development during cofiring, is much less than those of sintering potentials. Similar data are also obtained for the stress calculated using the linear shrinkage rate difference from the dilatometric measurements. The above results account for the absence of defects, such as de-densification, de-bonding and channel cracks in the cofired multilayer laminates. © 2011 Elsevier B.V. All rights reserved.