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Efficient boolean characteristic function for timed automatic test pattern generation
Journal article   Peer reviewed

Efficient boolean characteristic function for timed automatic test pattern generation

Yu-Min Kuo, Yue-Lung Chang and Shih-Chieh Chang
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.28(1), pp.417-425
01/2009

Abstract

Boolean function Logic design Modeling Timed characteristic function (TCF) Timing analysis
Timing analysis is critical for many circuit optimizations. An accurate timing analysis can be achieved by finding input vectors that simultaneously satisfy both functional and temporal requirements. The problem of finding such input vectors can be modeled as a Boolean equation called the timed characteristic function (TCF). Despite the usefulness of the TCF, traditional TCF construction and solving is slow for large circuits. In this paper, we present a more efficient way to use the TCF. On average, our method is much faster than other most recent works. © 2009 IEEE.

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