Electron Tomography at 2.4 Å Resolution

Journal article

M.C. Scott, Chien-Chun Chen, Matthew Mechlenburg, Chun Zhu, Rui Xu, Peter Ercius, Ulrich Dahmen, B.C. Regan and Jianwei Miao

Microscopy and Microanalysis, Vol.18(S2), pp.522-523

2012

Abstract

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Title: Electron Tomography at 2.4 Å Resolution
Translated title: Electron Tomography at 2.4 Å Resolution
Creators - without role: M.C. Scott - University of California, Los Angeles
Chien-Chun Chen - University of California, Los Angeles
Matthew Mechlenburg - University of California, Los Angeles
Chun Zhu - University of California, Los Angeles
Rui Xu - University of California, Los Angeles
Peter Ercius - NCEM , LBNL
Ulrich Dahmen - NCEM , LBNL
B.C. Regan - University of California, Los Angeles
Jianwei Miao - University of California, Los Angeles
Publication Details: Microscopy and Microanalysis, Vol.18(S2), pp.522-523
Identifiers: 9957771019606774
Academic Unit: Department of Engineering and System Science, College of Nuclear Science, National Tsing Hua University
Language: English
Resource Type: Journal article