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Electron field emission properties of nanomaterials on rough silicon rods
Journal article   Peer reviewed

Electron field emission properties of nanomaterials on rough silicon rods

Hung-Chi Wu, Tsung-Yen Tsai, Fu-Hsuan Chu, Nyan-Hwa Tai, Heh-Nan Lin, Hsin-Tien Chiu and Chi-Young Lee
Journal of Physical Chemistry C, Vol.114(1), pp.130-133
14/01/2010

Abstract

Highly porous, individually separated, and vertically aligned rough silicon rods (r-SiRs) were formed via a modified electroless metal deposition (EMD) approach. Despite inheriting the length of crowded silicon nanowires (NWs) obtained by the conventionally adopted EMD method, the r-SiRs are distributed sparsely, subsequently forming an excellent field emitter substrate. The electron field emission (EFE) of carbon nanotubes (CNTs) grown on r-SiRs can be turned on at (E0)CNTs/r-SiRs ) 2.3 V/μm, yielding a high EFE current density, (Je)CNTs/r-SiR ) 3.7 mA/cm2 in an applied field of 5.1 V/μm. Additionally, a cactuslike structure consisting of zinc oxide NWs on r-SiRs can be turned on at 2.9 V/μm. The absence of a high-temperature or expensive photolithographic process makes r-SiRs a promising alternative as a silicon base field emitter substrate. © 2010 American Chemical Society.

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