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Electron holography for improved measurement of microfields in nanoelectrode assemblies
Journal article   Peer reviewed

Electron holography for improved measurement of microfields in nanoelectrode assemblies

Li-Jen Chou, Mu-Tung Chang, Yu-Lun Chueh, Joong Jung Kim, Hyun Soon Park and Daisuke Shindo
Applied Physics Letters, Vol.89(2), 023112
2006

Abstract

An approach to investigate the electric field distribution and field-emission property of a single crystal tungsten oxide (WO 3 ) nanowire by electron holography technique is presented, which solves the problems encountered in the traditional reconstruction of the holograms, the so-called perturbed reference wave. We proposed this unique method to meticulously illustrate the status of the surroundings of a single crystal nanowire under biased conditions. This paves the way to precisely quantifying the electric and magnetic field distributions for nanostructures as well as nanodevices. © 2006 American Institute of Physics.

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