Logo image
Emergence of Ag particles and their effects on the mechanical properties of TaN-Ag nanocomposite thin films
Journal article   Peer reviewed

Emergence of Ag particles and their effects on the mechanical properties of TaN-Ag nanocomposite thin films

C.C. Tseng, J.H. Hsieh, W. Wu, S.Y. Chang and C.L. Chang
Surface and Coatings Technology, Vol.201(24), pp.9565-9570
15/10/2007

Abstract

C-AFM Co-sputtering Nanocomposite thin films TaN-Ag
TaN-Ag nanocomposite films were deposited by reactive co-sputtering on tool steel substrates. The films were then annealed using RTA (Rapid Thermal Annealing) at 350 °C for 2, 4, 8 min respectively to induce the nucleation and growth of Ag particles in TaN matrix and on film surface. C-AFM (Conductive Atomic force Microscopy) and FESEM (Field-Emission Scanning Electron Microscopy) were applied to examine the Ag nano-particles emerged on the surface of these thin films. A nano-indenter and a pin-on-disk tribometer were used to study the effect of annealing on the films' mechanical properties. The results reveal that annealing by RTA can cause Ag nano-particles to emerge on the TaN surface. Consequently, the mechanical properties of the films will vary depending on annealing conditions, Ag content, and Ag particle emergence. © 2007 Elsevier B.V. All rights reserved.

Metrics

1 Record Views

Details

Logo image