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Empirical Solutions and Reliability Assessment of Thermal Induced Creep Failure for Wafer Level Packaging
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Empirical Solutions and Reliability Assessment of Thermal Induced Creep Failure for Wafer Level Packaging

P.L. Wu, P.H. WangK.N. Chiang
IEEE Transactions on Device and Materials Reliability
2018

摘要

Creep creep Finite element Finite element analysis Mathematical model Reliability Semiconductor device modeling Soldering Strain Thermal WLCSP. Electronic Optical and Magnetic Materials Safety Risk Reliability and Quality Electrical and Electronic Engineering
The accelerated thermal cycling test (ATCT) is a method of testing electronic packaging reliability characteristic. A component must pass this test before being launched into the market. According to many studies, under thermal loading, the excessive thermal strain and stress occur between the package and substrate because of the CTE (coefficient of thermal expansion) mismatch, it damages the solder bump of electrical packaging. In the ATCT, -40&null to 125&null is the regular thermal range of packages tested. Furthermore, the homologous temperature exceeds one-third of the melting point (K) of solder, one should consider the accumulation of creep strain and estimate the creep behavior during the loading procedure, however, the creep strain is very sensitive to mesh size in finite element simulation. To get a stable and reliable creep stain for different packaging structures becomes a must for solder joint reliability assessment. In this research, we study a feasible and fixed element size, which should be chosen carefully for the same type of electronic packaging structure, e.g., Wafer Level Packaging (WLP), as it can affect simulation results and cause the prediction of packaging life cycle to deviate. In ATCT simulation, there is a big difference in reliability estimation for different element mesh size selection, even for all material properties and structure remain the same. It is essential to find an appropriate and fixed element size for packaging reliaility prediction to yield precise and reliable simulation results. This research aims to find an appropriate element mesh size that can consistently predict the reliability life of various WLPs in an accurate range, and the reliability results of different WLPs under the thermal cycling loading have been validated by experiments. Moreover, the simulation results are summarized using the Anand and hyperbolic sine creep models with suitable empirical reliability assessment equations, results shown both creep models can predict the reliability life of WLPs in an accurate range with appropriate mesh control.

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