Abstract
A facile wet soaking process by immersing a CIGS thin film in a mixed aqueous solution, containing gallium trichloride and thioacetamide at 80 °C for a few tens of seconds, was proposed to reduce the existence of defects in the CIGS absorption layer which can be confirmed by the temperature dependence of the open-circuit voltage (V oc ). The depth profiles of X-ray photoelectron spectroscopy (XPS) results indicate that the gallium (Ga) concentration increases during the short wet soaking time, resulting in a widening of the band gap near the surface region. The enhanced carrier lifetime attributed to the Ga-induced defect reduction during thermal treatment of device fabrication was evaluated by time-resolved photoluminescence (TRPL) spectroscopy. With wet and light soaking processes, V oc , short circuit current (J sc ) and fill factor (F.F.) can be increased, yielding a significant enhancement in cell efficiency from ∼1% to ∼6.4%. We believe that this fast, simple and effective method can further stimulate the development of CBD-Zn(O,S)/post-selenization CIGS solar cells toward commercialized thin film photovoltaics.