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Er-doped silicon nanowires with 1.54 μm light-emitting and enhanced electrical and field emission properties
Journal article   Peer reviewed

Er-doped silicon nanowires with 1.54 μm light-emitting and enhanced electrical and field emission properties

C.T. Huang, C.L. Hsin, K.W. Huang, C.Y. Lee, P.H. Yeh, U.S. Chen and L.J. Chen
Applied Physics Letters, Vol.91(9), 093133
2007

Abstract

Erbium-doped silicon nanowires have been grown via a vapor transport and condensation method with Er Cl3 6 H2 O powder as part of the source in one step. The Er-doped silicon nanowires exhibit the room temperature photoluminescence at a wavelength of 1.54 μm, ideal for optical communication. From I-V measurements, the resistivity of 4.2 at. % Er-doped Si nanowires was determined to be 1.5× 10-2 cm. The Er-doped silicon nanowires were found to possess excellent field emission properties with a field enhancement factor as high as 1260. The rich variety of enhanced physical properties exhibited by the Er-doped silicon nanowires points to versatile applications for advanced devices. c 2007 American Institute of Physics.

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