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Erratum: "Enhancing the reliability of wafer level packaging by using solder joints layout design"(IEEE Transactions on Components and Packaging Technologies)
Journal article   Peer reviewed

Erratum: "Enhancing the reliability of wafer level packaging by using solder joints layout design"(IEEE Transactions on Components and Packaging Technologies)

Chang-Ming Liu, Chang-Chun Lee and Kuo-Ning Chiang
IEEE Transactions on Components and Packaging Technologies, Vol.30(1), p.190
03/2007

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