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Fabrication and characterization of electrodeposited bismuth telluride films and nanowires
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Fabrication and characterization of electrodeposited bismuth telluride films and nanowires

Cheng-Lung Chen, Yang-Yuan Chen, Su-Jien Lin, James C. Ho, Ping-Chung Lee, Chii-Dong Chen and Sergey R. Harutyunyan
Journal of Physical Chemistry C, Vol.114(8), pp.3385-3389
04/03/2010

Abstract

To elucidate low-dimensional effects on thermoelectric materials, bismuth telluride film and nanowires array were fabricated by potentiostatically electrodeposition. Both materials are slightly Te-rich, n-type Bi 2 Te 3 , exhibiting preferred orientation in rhombohedral strcture. For both the Seebeck coefficient S ≈ -70 μV/K at 300 K decreases linearly with decreasing temperature, showing a diffusive nature of current flow. The temperature dependence of resistivity ()1/σ) of nanowires obtained from the data of a nanowires array and a single-nanowire reveals a better electric conductivity than that of the bulk. By coupling temperature-dependent thermal diffusivity and heat capacity data with a modified effective medium theory, a thermal conductivity κ of 0.75 W/(m K) was obtained at 300 K. The ZT was calculated to be 0.45 at 300 K and 0.9 at 350 K for Bi 2 Te 3 nanowires. © 2010 American Chemical Society.

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