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Failure mechanism of a low-temperature-cofired ceramic capacitor with an inner Ag electrode
Journal article   Open access   Peer reviewed

Failure mechanism of a low-temperature-cofired ceramic capacitor with an inner Ag electrode

Yi-Ting Shih, Jau-Ho Jean and Shih-Chang Lin
Journal of the American Ceramic Society, Vol.93(10), pp.3278-3283
10/2010

Abstract

Failure mechanism of a multilayer ceramic capacitor (MLCC) made of a low-fire BaNd 2 Ti 4 O 12 (BNT)1ZnO-B 2 O 3 (ZB) dielectric with an inner pure silver electrode at elevated temperatures and voltages has been investigated. A nonlinear current- voltage leakage characteristic is found when the degradation of MLCC occurs, and the time to failure decreases with increasingeither the temperature or the voltage. Results of microstructure, composition, and impedance analyses reveal that the failure is caused by silver diffusion in the ZB glass during sintering andhighly accelerated life test. © 2010 The American Ceramic Society.
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https://doi.org/10.1111/j.1551-2916.2010.03837.xView
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