摘要
In spite of the outstanding properties of single-walled carbon nanotubes (SWNTs), the coexistence of metallic and semiconducting SWNTs as a result of synthesis has hindered their electronic and photonic applications. We demonstrate a pump-probe microscopy method for fast, contact-free mapping of metallicity in individual SWNTs. We employ the phase of transient absorption as a contrast to discriminate metallic and semiconducting SWNTs. Furthermore, we have clarified the phase dependence on the pump or probe wavelengths and the energy structure of SWNTs. Our imaging method holds the potential of serving as a high-speed metallicity-mapping tool to assist the development of SWNT-based nanoelectronics.