Abstract
A discussion of CMOS readout technologies for infrared (IR) imaging systems is presented. First, the description of various types of IR detector materials and structures is given. The advances of detector fabrication technology and microelectronics process technology have led to the development of large format array of IR imaging detectors. For such large IR FPA's which is the critical component of the advanced infrared imaging system, general requirement and specifications are described. To support a good interface between FPA and downstream signal processing stage, both conventional and recently developed CMOS readout techniques are presented and discussed. Finally, future development directions including the smart focal plane concept are also introduced. © 1997 IEEE.